• DocumentCode
    67019
  • Title

    32 dBm Power Amplifier on 45 nm SOI CMOS

  • Author

    Wilk, Seth J. ; Lepkowski, William ; Thornton, Trevor J.

  • Author_Institution
    SJT Micropower Inc., Fountain Hills, CO, USA
  • Volume
    23
  • Issue
    3
  • fYear
    2013
  • fDate
    Mar-13
  • Firstpage
    161
  • Lastpage
    163
  • Abstract
    A silicon metal-semiconductor-field-effect-transistor (MESFET) power amplifier operating at 900 MHz fabricated on a 45 nm silicon-on-insulator CMOS process with no changes to the process flow is presented. The soft breakdown of the MESFET is 20 times that of the MOSFET and allowed a single transistor amplifier based on Class A bias conditions to operate at up to 32 dBm output power with an 8 V drain bias. The amplifier had a peak power added efficiency of 37.6%, gain of 11.1 dB, OIP3 of 39.3 dBm and 1 dB compression point at an output power of 31.6 dBm. The device required only 0.125 mm 2 of active area. Additionally, the depletion mode operation of the MESFET enables a simple input bias approach using an inductor to ground at the gate of the device.
  • Keywords
    CMOS analogue integrated circuits; UHF power amplifiers; elemental semiconductors; power MESFET; silicon; silicon-on-insulator; MOSFET; SOI CMOS; class-A bias amplifier; depletion mode operation; efficiency 37.6 percent; frequency 900 MHz; gain 11.1 dB; inductor; silicon MESFET power amplifier; silicon metal semiconductor field effect transistor power amplifier; silicon-on-insulator CMOS process; single-transistor amplifier; size 45 nm; voltage 8 V; CMOS integrated circuits; Logic gates; MESFETs; Power amplifiers; Power generation; Power measurement; Silicon; Metal-semiconductor-field-effect-transistor (MESFET); power amplifiers (PAs); silicon-on-insulator (SOI) technology;
  • fLanguage
    English
  • Journal_Title
    Microwave and Wireless Components Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1531-1309
  • Type

    jour

  • DOI
    10.1109/LMWC.2013.2245413
  • Filename
    6469182