Influence of charged samples on imaging in scanning ion conductance microscopy

Author

Ishizaki, K. ; Ushiki, Tatsuo ; Nakajima, Masahiro ; Iwata, Futoshi

Author_Institution

Grad. Sch. of Eng., Shizuoka Univ., Hamamatsu, Japan

fYear

2013

fDate

10-13 Nov. 2013

Firstpage

1

Lastpage

4

Abstract

Scanning ion Conductance Microscope (SICM), a member of the family of scanning probe microscopes, can image living samples without damages by detecting ion current through the pipette with 100 nm aperture. For SICM imaging of biological samples, there is a possibility of influence of charge condition of the sample surface on the ion current detected by SICM. In this research, we investigated the influence of charged sample on SICM imaging. A chromosome of Indian Muntjac (Barking Deer) which has strong negative surface charge was investigated. In imaging mode using DC bias, it is difficult to obtain the topographic image with a negative potential of the nanopipette electrode. The ion current behavior in SICM imaging was investigated by obtaining approach curve, ion current behavior as the pipette approaching to the sample, and current-voltage curve were investigated.

Keywords

biological techniques; cellular biophysics; scanning probe microscopy; DC bias; SICM imaging; biological samples; charged sample influence; chromosome; current-voltage curve; image topography; ion current behavior; ion current detection; nanopipette electrode; negative potential; negative surface charge; scanning ion conductance microscopy imaging; scanning probe microscopy; wavelength 100 nm; Biological cells; Electric potential; Electrodes; Microscopy; Nanobioscience; Surface topography;

fLanguage

English

Publisher

ieee

Conference_Titel

Micro-NanoMechatronics and Human Science (MHS), 2013 International Symposium on

Conference_Location

Nagoya

Print_ISBN

978-1-4799-1527-9

Type

conf

DOI

10.1109/MHS.2013.6710400

Filename

6710400