• DocumentCode
    673503
  • Title

    A general framework for high precision computation of singular integrals in Galerkin SIE formulations

  • Author

    Polimeridis, Athanasios G. ; Vipiana, Francesca ; Mosig, Juan R. ; Wilton, Donald R.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Massachusetts Inst. of Technol., Cambridge, MA, USA
  • fYear
    2013
  • fDate
    7-13 July 2013
  • Firstpage
    454
  • Lastpage
    455
  • Abstract
    The direct evaluation method was originally introduced in computational electromagnetics as a semi-analytical method for high precision computation of singular Galerkin inner products arising in surface integral equation formulations over planar triangular tesselations. Recently, the basic philosophy of the direct evaluation method was utilized for the development of fully numerical schemes. Here, we describe how these novel algorithms could lead to a general framework for accommodating, without significant retooling, a considerably wider repertoire of applications including weakly singular and strongly singular integrals with high-order basis/testing functions over curved surfaces and possibly with Green´s functions expressed in spectral integral form, as well as singular integrals arising in shape derivatives of sensitivity analysis.
  • Keywords
    Galerkin method; Green´s function methods; computational electromagnetics; integral equations; sensitivity analysis; Green´s functions; computational electromagnetics; curved surfaces; direct evaluation method; high-order basis-testing functions; planar triangular tesselations; semianalytical method; sensitivity analysis; shape derivatives; singular Galerkin inner products; spectral integral form; strongly singular integrals; surface integral equation formulations; weakly singular integrals; Antennas; Green´s function methods; Integral equations; Kernel; Method of moments; Shape; Surface impedance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium (APSURSI), 2013 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1522-3965
  • Print_ISBN
    978-1-4673-5315-1
  • Type

    conf

  • DOI
    10.1109/APS.2013.6710888
  • Filename
    6710888