Near-field to far-field transformation based on stratton-chu fomula for EMC measurements

Author

Jeong-Seok Lee ; Tae-Lim Song ; Jin-Kyoung Du ; Jong-Gwan Yook

Author_Institution

Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea

fYear

2013

fDate

7-13 July 2013

Firstpage

606

Lastpage

607

Abstract

This paper deals with the near-field to far-field transformation for electromagnetic compatibility (EMC) testing. Since the conventional EMC testing has an inefficient measurement process, Stratton-Chu formula is used to predict the far-field emission by a simple and direct process. The near-filed of a microstrip patch antenna is extracted at regular interval from the focused plane, and the far-field is generated from the near-field by Stratton-Chu formula. Through the three-dimensional electromagnetic (EM) field simulation, calculated far-field results of the patch antenna from Stratton-Chu formula computation are proven to be available. In comparison with full-wave analysis, outcomes of computed far-field have error less than 3.1%.

Keywords

electromagnetic compatibility; microstrip antennas; EMC measurement; EMC testing; Stratton-Chu fomula computation; electromagnetic compatibility testing; far-field emission prediction; focused plane; full-wave analysis; microstrip patch antenna; near-field-to-far-field transformation; three-dimensional EM field simulation; three-dimensional electromagnetic field simulation; Antenna measurements; Electromagnetic compatibility; Equations; Patch antennas; Testing; Vectors;

fLanguage

English

Publisher

ieee

Conference_Titel

Antennas and Propagation Society International Symposium (APSURSI), 2013 IEEE

Conference_Location

Orlando, FL

ISSN

1522-3965

Print_ISBN

978-1-4673-5315-1

Type

conf

DOI

10.1109/APS.2013.6710963

Filename

6710963