• DocumentCode
    674248
  • Title

    Combining gait and face for tackling the elapsed time challenges

  • Author

    Yu Guan ; Xingjie Wei ; Chang-Tsun Li ; Marcialis, Gian Luca ; Roli, F. ; Tistarelli, Massimo

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Warwick, Coventry, UK
  • fYear
    2013
  • fDate
    Sept. 29 2013-Oct. 2 2013
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Random Subspace Method (RSM) has been demonstrated as an effective framework for gait recognition. Through combining a large number of weak classifiers, the generalization errors can be greatly reduced. Although RSM-based gait recognition system is robust to a large number of covariate factors, it is, in essence an unimodal biometric system and has the limitations when facing extremely large intra-class variations. One of the major challenges is the elapsed time covariate, which may affect the human walking style in an unpredictable manner. To tackle this challenge, in this paper we propose a multimodal-RSM framework, and side face is used to strengthen the weak classifiers without compromising the generalization power of the whole system. We evaluate our method on the TUM-GAID dataset, and it significantly outperforms other multimodal methods. Specifically, our method achieves very competitive results for tackling the most challenging elapsed time covariate, which potentially also includes the changes in shoe, carrying status, clothing, lighting condition, etc.
  • Keywords
    face recognition; gait analysis; image classification; RSM-based gait recognition system; TUM-GAID dataset; covariate factors; elapsed time covariate; face recognition system; generalization error reduction; human walking style; intraclass variations; multimodal-RSM framework; random subspace method; unimodal biometric system; weak classifiers; Face; Feature extraction; Footwear; Gait recognition; Kernel; Probes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biometrics: Theory, Applications and Systems (BTAS), 2013 IEEE Sixth International Conference on
  • Conference_Location
    Arlington, VA
  • Type

    conf

  • DOI
    10.1109/BTAS.2013.6712749
  • Filename
    6712749