DocumentCode
674986
Title
Simultaneous improvement of area, delay, and fault tolerance in quantum circuits
Author
Nabizadeh, Zahra ; Sedighi, Mehdi ; Zamani, Morteza Saheb
Author_Institution
Dept. of Comput. Eng. & Inf. Technol., Amirkabir Univ. of Technol., Tehran, Iran
fYear
2013
fDate
30-31 Oct. 2013
Firstpage
59
Lastpage
64
Abstract
Fault tolerance is a necessity for successful realization of quantum circuits. Achieving fault tolerance in quantum circuits is more complicated than classic circuits due to their inherent characteristics such as error continuum, destruction of quantum state after measurement, and no-cloning. Adding fault tolerance should incur a reasonably minimal overhead in latency and area. In this paper, a new approach for implementation of fault tolerant quantum circuits is proposed. The correction blocks are arranged in such a way that the overall circuit area and delay are reduced. This will also lead to a reduction in error distance in the circuit. The correctness of the proposed approach is mathematically proven in the paper. Experimental results confirm the analytical expectations and show an average improvement of 47.8% in terms of delay, 17.6% in terms of area, and 47.8% in terms of error distance.
Keywords
delays; fault tolerance; logic circuits; quantum gates; area; correction blocks; error continuum; error distance reduction; fault tolerance; minimal overhead; quantum circuits; quantum state destruction; Benchmark testing; Computer architecture; Delays; Equations; Fault tolerance; Fault tolerant systems; Logic gates; Error detection and correction; Fault tolerant quantum circuit; Quantum measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Architecture and Digital Systems (CADS), 2013 17th CSI International Symposium on
Conference_Location
Tehran
Print_ISBN
978-1-4799-0562-1
Type
conf
DOI
10.1109/CADS.2013.6714238
Filename
6714238
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