• DocumentCode
    675573
  • Title

    Opportunities in 3D substrate bonding

  • Author

    Matthias, T. ; Uhrmann, Thomas ; Dragoi, Viorel ; Lindner, Philipp

  • Author_Institution
    EV Group, St. Florian am Inn, Austria
  • fYear
    2013
  • fDate
    7-10 Oct. 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Vertical stacking of thin chips combined with Through-Silicon-Vias (TSVs) as interconnects is an attractive path to higher functional density of ICs. Different functional entities of a device are manufactured separately and later integrated by wafer bonding. This enables a modular device architecture and thus a modular manufacturing supply chain. Device manufacturers can focus on their core competence, e.g., designing and building the ASIC, and then add standardized modules, such as logic controllers or memory, from other manufacturers. Stacking dies enables the electrical performance of a system-on-chip, but it reduces the design time, complexity and cost significantly. Wafer bonding is a key manufacturing technology for 3D ICs. Fusion wafer bonding, which was initally developed for SOI wafer manufacturing is the most promising wafer stacking technology for 3D ICs.
  • Keywords
    application specific integrated circuits; integrated circuit interconnections; system-on-chip; three-dimensional integrated circuits; wafer bonding; 3D substrate bonding; ASIC; IC; TSV; core competence; design time reduction; electrical performance; functional density; functional entities; logic controllers; memory; modular device architecture; modular manufacturing supply chain; stacking dies; standardized modules; system-on-chip; thin chips; through-silicon-vias; vertical stacking; wafer bonding; Annealing; Bonding; Plasma temperature; Stacking; Three-dimensional displays; Wafer bonding; 3D IC; More-than-Moore; direct bonding; fusion bonding; low-temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2013 IEEE
  • Conference_Location
    Monterey, CA
  • Type

    conf

  • DOI
    10.1109/S3S.2013.6716528
  • Filename
    6716528