• DocumentCode
    67621
  • Title

    Comparison of lead Zirconate Titanate thin films for microelectromechanical energy harvester with interdigitated and parallel plate electrodes

  • Author

    Chidambaram, N. ; Mazzalai, A. ; Balma, D. ; Muralt, Paul

  • Author_Institution
    Lab. de Ceramique, Ecole Polytech. Fed. de Lausanne, Lausanne, Switzerland
  • Volume
    60
  • Issue
    8
  • fYear
    2013
  • fDate
    Aug-13
  • Firstpage
    1564
  • Lastpage
    1571
  • Abstract
    Lead zirconate titanate (PZT) thin films on insulator- buffered silicon substrates with interdigitated electrodes (IDEs) have the potential to harvest more energy than parallel plate electrode (PPE) structures because the former exploit the longitudinal piezoelectric effect, which is about twice as high as the transverse piezoelectric effect used by PPE structures. In this work, both options are compared with respect to dielectric, ferroelectric, and piezoelectric properties, leakage currents, and figure of merit (FOM) for energy harvesting. The test samples were silicon beams with {100} PZT thin films in the case of the PPE geometry, and random PZT thin films for the IDE geometry. Both films were obtained by an identical sol-gel route. Almost the same dielectric constants were derived when the conformal mapping method was applied for the IDE capacitor to correct for the IDE geometry. The dielectric loss was smaller in the IDE case. The ferroelectric loops showed a higher saturation polarization, a higher coercive field, and less back-switching for the IDE case. The leakage current density of the IDE structure was measured to be about 4 orders of magnitude lower than that of the PPE structure. The best FOM of the IDE structures was 20% superior to that of the PPE structures while also having a voltage response that was ten times higher (12.9 mV/μ strain).
  • Keywords
    current density; dielectric losses; dielectric polarisation; electrodes; energy harvesting; ferroelectric coercive field; ferroelectric switching; ferroelectric thin films; lead compounds; leakage currents; micromechanical devices; piezoelectric thin films; piezoelectric transducers; piezoelectricity; PZT; Si; back-switching; coercive field; conformal mapping method; dielectric constants; dielectric loss; dielectric properties; energy harvesting; ferroelectric loops; ferroelectric properties; insulator-buffered silicon substrates; interdigitated electrode capacitor; interdigitated electrode geometry; interdigitated electrode structure; lead zirconate titanate thin films; leakage current density; longitudinal piezoelectric effect; microelectromechanical energy harvester; parallel plate electrode geometry; parallel plate electrode structures; piezoelectric properties; random PZT thin films; saturation polarization; silicon beams; sol-gel route; transverse piezoelectric effect; voltage response; {100} PZT thin films; Approximation methods; Electric fields; Electrodes; Films; Geometry; Silicon; Substrates;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2013.2736
  • Filename
    6573432