• DocumentCode
    676373
  • Title

    Testing reliability techniques for SoCs with fault tolerant CGRA by using live FPGA fault injection

  • Author

    Kuuhn, Johannes Maximilian ; Schweizer, Thomas ; Peterson, Donald ; Kuhn, Thomas ; Rosenstiel, Wolfgang

  • Author_Institution
    Comput. Eng., Eberhard Karls Univ. Tubingen, Tubingen, Germany
  • fYear
    2013
  • fDate
    9-11 Dec. 2013
  • Firstpage
    462
  • Lastpage
    465
  • Abstract
    In this work, we intend to demonstrate a number of reliability techniques developed for Coarse Grained Reconfigurable Architectures (CGRA). The techniques to be demonstrated target different portions of a System on Chip (SoC) Design consisting of a general purpose CPU, various accelerators and a CGRA which may be used for application acceleration as well. On the CGRA we will demonstrate a light-weight Triple Modular Redundancy (TMR) technique which mitigates the hardware overhead usually incurred by TMR. In case of a detected CGRA fault, we use Dynamic Remapping of the application to avoid faulty components and thus restore the functionality of the mapped application. On SoC level, we demonstrate Dynamic Functional Verification to sample and thus detect faults in components of the SoC in a time multiplexed manner. The complete system is emulated on a Field Programmable Gate Array (FPGA) for which we developed a fast and accurate fault injection method to test the developed techniques in a live and realistic way.
  • Keywords
    fault tolerance; field programmable gate arrays; integrated circuit reliability; logic design; reconfigurable architectures; redundancy; system-on-chip; SoC design; TMR technique; coarse grained reconfigurable architectures; dynamic functional verification; dynamic remapping; fault injection method; fault tolerant CGRA; field programmable gate array; live FPGA; system on chip design; testing reliability technique; triple modular redundancy technique; Circuit faults; Computer architecture; Context; Field programmable gate arrays; Reliability; System-on-chip; Tunneling magnetoresistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Field-Programmable Technology (FPT), 2013 International Conference on
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-1-4799-2199-7
  • Type

    conf

  • DOI
    10.1109/FPT.2013.6718415
  • Filename
    6718415