• DocumentCode
    677883
  • Title

    Steganalysis for JPEG Images Using Extreme Learning Machine

  • Author

    Bhasin, Veenu ; Bedi, Punam

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Delhi, New Delhi, India
  • fYear
    2013
  • fDate
    13-16 Oct. 2013
  • Firstpage
    1361
  • Lastpage
    1366
  • Abstract
    This paper proposes a novel blind Steganalysis process, for colored JPEG images. Extreme Learning Machine (ELM) has been used in the paper to classify the images into stego images and non-stego images. The feature set used for classification of images consists of 810 features. First 405 features are based on Markov random process applied on correlations among JPEG coefficients of image. Calibration is applied on these Markov features to get the remaining 405 features. These calibrated features are the difference between the Markov features of the image and Markov features of a reference image, obtained by decompressing, cropping and recompressing the image. Experimental results show that our proposed ELM based steganalysis method clearly outperforms other SVM based steganalysis methods in terms of percentage of correctly classified images and in terms of time taken for both training and testing. The fast speed of the proposed method due to fast learning time of ELM makes it useful for real-time steganalysis.
  • Keywords
    Markov processes; calibration; data compression; feature extraction; image classification; image coding; image colour analysis; learning (artificial intelligence); steganography; support vector machines; ELM; JPEG image coefficients; Markov random process; SVM based steganalysis methods; blind steganalysis process; colored JPEG images; extreme learning machine; feature calibration; image classification; image cropping; image decompression; image recompression; nonstego image; reference image Markov features; stego images; Arrays; Feature extraction; Markov processes; Neurons; Support vector machines; Training; Transform coding; Calibration; ELM; JPEG images; Markov Random Process; Steganalysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems, Man, and Cybernetics (SMC), 2013 IEEE International Conference on
  • Conference_Location
    Manchester
  • Type

    conf

  • DOI
    10.1109/SMC.2013.235
  • Filename
    6721988