DocumentCode
678338
Title
Design and Development of FPGA based VMEbus interface controller (VIC) for Computer based I&C systems of fast reactors
Author
Komanduri, Ranga ; Murthy, D. Thirugnana
Author_Institution
Electron. & Instrum. Div. (EID), Indira Gandhi Centre for Atomic Res. (IGCAR), Kalpakkam, India
fYear
2013
fDate
13-15 Dec. 2013
Firstpage
1
Lastpage
6
Abstract
Versa Module Eurocard (VME) backplane bus based architecture has been standardized for Real Time Computer (RTC) based I&C systems of Indian fast reactors. A typical RTC consists of a CPU card and a set of I/O cards. VMEbus based CPU card is currently being used in the computer based I&C systems of FBTR at IGCAR. The CPU card uses a commercial VMEbus Interface controller (VIC), which is now obsolete, to perform the functions of VMEbus system controller, VMEbus master and Interrupt Handler. To solve the part obsolescence problem and support long term maintainability, it has been envisaged to prototype VIC in a Field Programmable Gate Array (FPGA). The specifications of the commercial VIC have been revised to suit the application, retaining only the features essential for the target application. This paper discusses the design, development, verification and testing of customized VIC.
Keywords
control system synthesis; field buses; field programmable gate arrays; fission reactor design; fission reactor instrumentation; input-output programs; interrupters; liquid metal fast breeder reactors; nuclear electronics; nuclear engineering computing; physical instrumentation control; real-time systems; FBTR; FPGA based VMEbus interface controller; I/O cards; IGCAR; Indian fast reactors; RTC based I&C systems; VIC; VMEbus based CPU card; VMEbus master; VMEbus system controller; Versa Module Eurocard; field programmable gate array; interrupt handler; maintainability; obsolescence problem; real time computer; Central Processing Unit; Clocks; Computers; Control systems; Radiation detectors; Registers; Safety; CPU card; FPGA; VIC; VMEbus; design; development; maintainability; obsolescence; verification;
fLanguage
English
Publisher
ieee
Conference_Titel
India Conference (INDICON), 2013 Annual IEEE
Conference_Location
Mumbai
Print_ISBN
978-1-4799-2274-1
Type
conf
DOI
10.1109/INDCON.2013.6725871
Filename
6725871
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