DocumentCode
680655
Title
Self-organized reliability suitable for Wireless Networked MPSoC
Author
Heil, M. ; Tanougast, Camel ; Killian, Cedric ; Dandache, A.
Author_Institution
Univ. de Lorraine, Metz, France
fYear
2013
fDate
15-18 Dec. 2013
Firstpage
1
Lastpage
4
Abstract
This paper presents a self-organized reliability technique to efficiently handle error localization in a Wireless Networked MPSoC. The wireless multi-node system consists of several nodes integrating MPSoC based Network-on-Chip (NoC) and communicating through ZigBee communication. We focus on the error detection and localization in NoCs located in each node of the wireless multi-node system. We propose a new offline test mechanism to efficiently detect and locate permanent errors in the networked NoCs. The proposed mechanism relies on delocalized tests performed through ZigBee wireless communication. We give the basic concepts of the proposed approach and timing estimations.
Keywords
Zigbee; integrated circuit reliability; network-on-chip; telecommunication network reliability; NoC; ZigBee wireless communication; error detection; error localization; network-on-chip; offline test mechanism; self-organized reliability technique; wireless multinode system; wireless networked MPSoC; Ad hoc networks; Estimation; Switches; Timing; Wireless communication; Wireless sensor networks; Zigbee;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics (ICM), 2013 25th International Conference on
Conference_Location
Beirut
Print_ISBN
978-1-4799-3569-7
Type
conf
DOI
10.1109/ICM.2013.6735020
Filename
6735020
Link To Document