• DocumentCode
    680655
  • Title

    Self-organized reliability suitable for Wireless Networked MPSoC

  • Author

    Heil, M. ; Tanougast, Camel ; Killian, Cedric ; Dandache, A.

  • Author_Institution
    Univ. de Lorraine, Metz, France
  • fYear
    2013
  • fDate
    15-18 Dec. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents a self-organized reliability technique to efficiently handle error localization in a Wireless Networked MPSoC. The wireless multi-node system consists of several nodes integrating MPSoC based Network-on-Chip (NoC) and communicating through ZigBee communication. We focus on the error detection and localization in NoCs located in each node of the wireless multi-node system. We propose a new offline test mechanism to efficiently detect and locate permanent errors in the networked NoCs. The proposed mechanism relies on delocalized tests performed through ZigBee wireless communication. We give the basic concepts of the proposed approach and timing estimations.
  • Keywords
    Zigbee; integrated circuit reliability; network-on-chip; telecommunication network reliability; NoC; ZigBee wireless communication; error detection; error localization; network-on-chip; offline test mechanism; self-organized reliability technique; wireless multinode system; wireless networked MPSoC; Ad hoc networks; Estimation; Switches; Timing; Wireless communication; Wireless sensor networks; Zigbee;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics (ICM), 2013 25th International Conference on
  • Conference_Location
    Beirut
  • Print_ISBN
    978-1-4799-3569-7
  • Type

    conf

  • DOI
    10.1109/ICM.2013.6735020
  • Filename
    6735020