Abstract :
The following topics are dealt with: system calibration; RF device modeling & linearization; loadpull; measurement systems; on-wafer measurements; and interactive forum.
Keywords :
calibration; measurement systems; microwave measurement; semiconductor device models; RF device linearization; RF device modeling; interactive forum; loadpull; measurement systems; on-wafer measurements; system calibration;
Conference_Titel :
Microwave Measurement Conference, 2013 82nd ARFTG
Conference_Location :
Columbus, OH
DOI :
10.1109/ARFTG-2.2013.6737333
