DocumentCode
682190
Title
Evaluation on uncertainty of noise parameter against commercial measurement
Author
Wu Aihua ; Liang Faguo ; Han Lihua ; Liu Chen ; Zhai Yuwei ; Zheng Yanqiu
Author_Institution
Hebei Semicond. Res. Inst., Shijiazhuang, China
Volume
1
fYear
2013
fDate
16-19 Aug. 2013
Firstpage
441
Lastpage
445
Abstract
This paper starts the work of evaluation on uncertainty of noise parameters against commercial measurement system built by PNA-X VAN from Agilent and Tuner from Maury, analyzes the input and output data of the measurement system, builds measurement model, designs the method of uncertainty evaluation that can meet requirement of international standard ISO/IEC98-3, develops simulation software and gets four uncertainty data of noise parameter. Through the comparing measurement with same type of system from Agilent and Tsinghua University, it is proved that the uncertainty evaluation data is reasonable and valid.
Keywords
electric noise measurement; measurement uncertainty; ISO/IEC98-3 international standard; commercial measurement; measurement model; measurement system; noise parameter; simulation software; uncertainty; Mathematical model; Measurement uncertainty; Noise; Noise measurement; Optimized production technology; Semiconductor device measurement; Uncertainty; Monte Carlo method; PNA-X VNA; Tuner; noise parameter measurement; uncertainty evaluation;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Measurement & Instruments (ICEMI), 2013 IEEE 11th International Conference on
Conference_Location
Harbin
Print_ISBN
978-1-4799-0757-1
Type
conf
DOI
10.1109/ICEMI.2013.6743024
Filename
6743024
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