Title :
Evaluation on uncertainty of noise parameter against commercial measurement
Author :
Wu Aihua ; Liang Faguo ; Han Lihua ; Liu Chen ; Zhai Yuwei ; Zheng Yanqiu
Author_Institution :
Hebei Semicond. Res. Inst., Shijiazhuang, China
Abstract :
This paper starts the work of evaluation on uncertainty of noise parameters against commercial measurement system built by PNA-X VAN from Agilent and Tuner from Maury, analyzes the input and output data of the measurement system, builds measurement model, designs the method of uncertainty evaluation that can meet requirement of international standard ISO/IEC98-3, develops simulation software and gets four uncertainty data of noise parameter. Through the comparing measurement with same type of system from Agilent and Tsinghua University, it is proved that the uncertainty evaluation data is reasonable and valid.
Keywords :
electric noise measurement; measurement uncertainty; ISO/IEC98-3 international standard; commercial measurement; measurement model; measurement system; noise parameter; simulation software; uncertainty; Mathematical model; Measurement uncertainty; Noise; Noise measurement; Optimized production technology; Semiconductor device measurement; Uncertainty; Monte Carlo method; PNA-X VNA; Tuner; noise parameter measurement; uncertainty evaluation;
Conference_Titel :
Electronic Measurement & Instruments (ICEMI), 2013 IEEE 11th International Conference on
Conference_Location :
Harbin
Print_ISBN :
978-1-4799-0757-1
DOI :
10.1109/ICEMI.2013.6743024