• DocumentCode
    682199
  • Title

    Mechanical and electrical device condition trend prediction based on GA-SVR

  • Author

    Lu Zhengchun ; Xing Jishou

  • Author_Institution
    Sch. of Mech. & Electr. Eng., Beijing Inf. Sci. & Technol. Univ., Beijing, China
  • Volume
    1
  • fYear
    2013
  • fDate
    16-19 Aug. 2013
  • Firstpage
    49
  • Lastpage
    52
  • Abstract
    This paper mainly discuss three kinds of optimization method to get the optimal penalty factor C and kernel parameter G of support vector regression. the mean square error MSE, correlation coefficient R, the number of support vector nsv was regarded as indexes to measure the merits of the various optimization prediction model, the experimental results shows that the prediction model based on genetic optimization is closer to the actual value in the prediction of vibration intensity, and prediction performance is better than other optimization methods. It also shows the prediction model has a good predictive ability on the condition trend of mechanical and electrical device.
  • Keywords
    condition monitoring; correlation methods; genetic algorithms; mean square error methods; prediction theory; regression analysis; support vector machines; correlation coefficient; electrical device condition trend prediction; genetic optimization; kernel parameter G; mean square error; mechanical device condition trend prediction; optimal penalty factor C; optimization method; prediction performance; support vector regression; vibration intensity; Educational institutions; Kernel; Market research; Optimization; Predictive models; Support vector machines; Vibrations; MSE; PSO; SVR; genetic optimization; trend prediction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Measurement & Instruments (ICEMI), 2013 IEEE 11th International Conference on
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4799-0757-1
  • Type

    conf

  • DOI
    10.1109/ICEMI.2013.6743036
  • Filename
    6743036