• DocumentCode
    682884
  • Title

    Oxide passivated low reflection nano-structured solar cell

  • Author

    Cheow Siu Leong ; Sopian, K. ; Zaidi, Saleem H.

  • Author_Institution
    Solar Energy Res. Inst. (SERI), Univ. Kebangsaan Malaysia, Bangi, Malaysia
  • fYear
    2013
  • fDate
    16-21 June 2013
  • Firstpage
    1260
  • Lastpage
    1264
  • Abstract
    The main processes in conventional silicon solar cell manufacturing are surface cleaning, saw damage removal, and texturing. These steps require excessive water and chemical usage. In addition 10% of the wafers are wasted through etching. These steps are followed by surface passivation and reflection reduction through expensive and inflammable, toxic-gas based plasma enhanced chemical vapor deposition process for deposition of high index anti-reflection SiN films. Surface reflection measurements from these surfaces have been carried out was comparable or 1% lower than SiN-coated surfaces and eliminating the need for deposition of high index SiN films. Si nanostructure passivation has been achieved with an oxide film grown as part of the POCl3 emitter process. These innovations have significantly reduced water and chemical usage, and have also eliminated expensive, silane-based plasma processing without restructuring the existing industrial manufacturing process.
  • Keywords
    nanotechnology; passivation; solar absorber-convertors; solar cells; POCl3 emitter process; low reflection solar cell; nanostructured solar cell; oxide film grown; oxide passivated solar cell; silicon nanostructure passivation; surface reflection; Films; Passivation; Photovoltaic cells; Reflection; Silicon; Surface texture; in-situ oxide passivation; monofacial solar cells; silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
  • Conference_Location
    Tampa, FL
  • Type

    conf

  • DOI
    10.1109/PVSC.2013.6744370
  • Filename
    6744370