Electron microscopy study of individual grain boundaries in Cu2ZnSnSe4 thin films

Author

Zhiwei Wang ; Jones, K.M. ; Norman, Andrew G. ; Moseley, John ; Repins, I.L. ; Noufi, Rommel ; Yanfa Yan ; Al-Jassim, M.M.

Author_Institution

Nat. Renewable Energy Lab., Golden, CO, USA

fYear

2013

fDate

16-21 June 2013

Firstpage

1681

Lastpage

1684

Abstract

We study the structural, chemical, and electronic properties of individual grain boundaries in Cu₂ZnSnSe₄ (CZTSe) using combined electron microscopy techniques including scanning electron microscopy-based cathodoluminescence (CL)-spectrum imaging and scanning transmission electron microscopy-based Z-contrast imaging and energy-dispersive spectroscopy profiling. Two representative grain boundaries have been studied. We find that the grain boundary that exhibits a redshift in the CL spectrum image is found to link to a ZnSe second phase. The grain boundary showing no redshift in the CL spectrum image is not linked to any secondary phase. The stability of CZTSe cross-section samples with storage time is also discussed.

Keywords

X-ray chemical analysis; cathodoluminescence; grain boundaries; red shift; scanning electron microscopy; scanning-transmission electron microscopy; semiconductor growth; semiconductor thin films; ternary semiconductors; vacuum deposition; Cu₂ZnSnSe₄; chemical properties; electronic properties; energy-dispersive spectroscopy profiling; grain boundaries; red shift; scanning electron microscopy-based cathodoluminescence-spectrum imaging; scanning transmission electron microscopy-based Z-contrast imaging; storage time; structural properties; thin films; Chemicals; Grain boundaries; Photovoltaic cells; Scanning electron microscopy; Transmission electron microscopy; Cu2ZnSnSe4; cathodoluminescence; electron microscopy; grain boundary; polycrystalline thin film;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th

Conference_Location

Tampa, FL

Type

conf

DOI

10.1109/PVSC.2013.6744468

Filename

6744468