DocumentCode
682974
Title
Nonuniform degradation and hot spots in thin film PV
Author
Vasko, Anthony ; Karpov, Victor
Author_Institution
Univ. of Toledo, Toledo, OH, USA
fYear
2013
fDate
16-21 June 2013
Firstpage
1831
Lastpage
1835
Abstract
Patterns of efficiency degradation in thin film PV reveal noticeable variations between nominally identical cells. This and some other observations point at laterally nonuniform degradation driven by weak spots on a cell. These spots can be either preexisting or caused by fluctuation of stresses and temperature; they deteriorate in a runaway mode evolving towards effective linear or nonlinear shunts. Here we present a simplified analytical treatment and numerical modeling of such a nonuniform degradation tracking local deterioration and effects of weak spots on the integral cell parameters.
Keywords
numerical analysis; photovoltaic cells; solar cells; thin film devices; integral cell parameter; linear shunt; nonlinear shunt; nonuniform degradation tracking local deterioration; numerical modeling; stress fluctuation; thin film PV solar cell; weak spot effect; Degradation; Fluctuations; Heating; Mathematical model; Photovoltaic cells; Resistance; Stress; degradation; efficiency; nonuniformity;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location
Tampa, FL
Type
conf
DOI
10.1109/PVSC.2013.6744498
Filename
6744498
Link To Document