DocumentCode
684101
Title
High temperature behavior of ceramic substrates for power electronics applications
Author
Roske, L. ; Lebey, T. ; Valdez-Nava, Zarel
Author_Institution
Lab. Laplace, Univ. de Toulouse, Toulouse, France
fYear
2013
fDate
20-23 Oct. 2013
Firstpage
595
Lastpage
598
Abstract
Aluminium oxide (Al2O3), Aluminium Nitride (AlN) and Silicon Nitride (Si3N4) are ceramics commonly used in power electronics modules, and are the current candidates for high temperature applications. A first study has previously shown different charge displacement behaviors at high temperature (up to 400°C). Surface potential measurements revealed a fast decay for AlN and Al2O3 with the increase of the temperature while on Si3N4 charges remain on surface at 400°C. However, these charges may move through the surface or be injected in the volume of the ceramics. - Surface potential results are correlated with broadband impedance spectroscopy and to current-voltage measurements of the ceramics. AlN and Al2O3 have a resistive-like behavior at high temperature, characterized by a space charge limited conduction current mechanism at high fields. For Si3N4, despite its resistivity decreases with temperature, it shows a dielectric behavior and an ohmic conduction mechanism over the studied temperature and field ranges.
Keywords
III-V semiconductors; aluminium compounds; ceramic packaging; electric current measurement; electrical resistivity; silicon compounds; space-charge-limited conduction; surface charging; surface potential; voltage measurement; wide band gap semiconductors; Al2O3; AlN; Si3N4; aluminium nitride; aluminium oxide; broadband impedance spectroscopy; ceramic substrate; current-voltage measurement; dielectric behavior; high temperature behavior; ohmic conduction mechanism; power electronics module; resistivity; silicon nitride; space charge limited conduction current mechanism; surface potential measurement; temperature 400 degC; Aluminum oxide; Ceramics; Current measurement; Electric potential; Surface impedance; Temperature; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena (CEIDP), 2013 IEEE Conference on
Conference_Location
Shenzhen
Type
conf
DOI
10.1109/CEIDP.2013.6748139
Filename
6748139
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