• DocumentCode
    684101
  • Title

    High temperature behavior of ceramic substrates for power electronics applications

  • Author

    Roske, L. ; Lebey, T. ; Valdez-Nava, Zarel

  • Author_Institution
    Lab. Laplace, Univ. de Toulouse, Toulouse, France
  • fYear
    2013
  • fDate
    20-23 Oct. 2013
  • Firstpage
    595
  • Lastpage
    598
  • Abstract
    Aluminium oxide (Al2O3), Aluminium Nitride (AlN) and Silicon Nitride (Si3N4) are ceramics commonly used in power electronics modules, and are the current candidates for high temperature applications. A first study has previously shown different charge displacement behaviors at high temperature (up to 400°C). Surface potential measurements revealed a fast decay for AlN and Al2O3 with the increase of the temperature while on Si3N4 charges remain on surface at 400°C. However, these charges may move through the surface or be injected in the volume of the ceramics. - Surface potential results are correlated with broadband impedance spectroscopy and to current-voltage measurements of the ceramics. AlN and Al2O3 have a resistive-like behavior at high temperature, characterized by a space charge limited conduction current mechanism at high fields. For Si3N4, despite its resistivity decreases with temperature, it shows a dielectric behavior and an ohmic conduction mechanism over the studied temperature and field ranges.
  • Keywords
    III-V semiconductors; aluminium compounds; ceramic packaging; electric current measurement; electrical resistivity; silicon compounds; space-charge-limited conduction; surface charging; surface potential; voltage measurement; wide band gap semiconductors; Al2O3; AlN; Si3N4; aluminium nitride; aluminium oxide; broadband impedance spectroscopy; ceramic substrate; current-voltage measurement; dielectric behavior; high temperature behavior; ohmic conduction mechanism; power electronics module; resistivity; silicon nitride; space charge limited conduction current mechanism; surface potential measurement; temperature 400 degC; Aluminum oxide; Ceramics; Current measurement; Electric potential; Surface impedance; Temperature; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena (CEIDP), 2013 IEEE Conference on
  • Conference_Location
    Shenzhen
  • Type

    conf

  • DOI
    10.1109/CEIDP.2013.6748139
  • Filename
    6748139