DocumentCode
685447
Title
Discussion group summary [5 summaries]
fYear
2013
fDate
13-17 Oct. 2013
Firstpage
197
Lastpage
207
Abstract
The following topics are dealt with: BEOL; reliability of future technologies; reliability challenges for foundries/fabless; RRAM.
Keywords
foundries; integrated circuits; random-access storage; reliability; BEOL; RRAM; back end of line; fabless; foundries; reliability; Electromigration; Foundries; Materials; Reliability; Standards; Stress; Through-silicon vias;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop Final Report (IRW), 2013 IEEE International
Conference_Location
South Lake Tahoe, CA
ISSN
1930-8841
Print_ISBN
978-1-4799-0350-4
Type
conf
DOI
10.1109/IIRW.2013.6804193
Filename
6804193
Link To Document