DocumentCode :
686440
Title :
Dielectric properties of B-doped CaCu3Ti4O12 ceramics
Author :
Shengtao Li ; Yang Yang ; Wang Hui ; Jianying Li
Author_Institution :
State Key Lab. of Electr. Insulation & Power Equip., Xi´an Jiaotong Univ., Xi´an, China
fYear :
2011
fDate :
6-10 Sept. 2011
Firstpage :
482
Lastpage :
485
Abstract :
CaCu3Ti4O12 (CCTO) exhibiting high dielectric constants has recently attracted considerable attention because of the high dielectric constant of about 105 at radio frequency and good temperature stability over a wide temperature range. But high dielectric loss and low breakdown strength seriously affect its application. B2O3 is chosen as glassy phase and it can make grain grow rapidly and decrease the sintering temperature. Meanwhile, B2O3 can improve the breakdown strength of CCTO and decrease dielectric loss due to the increase of the density. It can be observed that B2O3 precipitate in grain boundaries and increase the resistance of grain boundary. The main CaCu3Ti4O12 phase was confirmed by X-ray diffraction, the microstructure with obvious grain and grain boundary structures was observed by scanning electron microscopy. This study indicates that the amount of B2O3 can increase the dielectric constant of CCTO keeping 104 in the frequency range from 10-1 Hz to 106 Hz and can also decrease the dielectric loss of CCTO since it can increase the resistance of the grain boundary. For the sample doped with 3 wt % B2O3, its dielectric constant is stable from 10-1 Hz to 106 Hz, the tanδ decrease to 0.06 compared with 0.7 at 1 kHz of the undoped CCTO sample, and its grain boundary resistance is obvious much bigger than other samples.
Keywords :
X-ray diffraction; boron compounds; calcium compounds; copper compounds; dielectric losses; electric breakdown; glass ceramics; grain boundaries; grain growth; permittivity; scanning electron microscopy; CaCu3Ti4O12:B2O3; X-ray diffraction; breakdown strength; ceramics; dielectric constants; dielectric loss; grain boundary structures; grain growth; microstructure; scanning electron microscopy; sintering temperature; Ceramics; Dielectric constant; Dielectric losses; Grain boundaries; Resistance; Temperature measurement; B2O3; CCTO; dielectric constant; dielectric loss; glass;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulating Materials (ISEIM), Proceedings of 2011 International Conference on
Conference_Location :
Kyoto
Print_ISBN :
978-4-88686-074-3
Type :
conf
DOI :
10.1109/ISEIM.2011.6826318
Filename :
6826318
Link To Document :
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