• DocumentCode
    686557
  • Title

    New insight into the mechanism of the spurious triggering pulse in the bridge-leg configuration

  • Author

    Jianjing Wang ; Chung, Henry Shu-Hung

  • Author_Institution
    Centre for Smart Energy Conversion & Utilization Res., City Univ. of Hong Kong, Hong Kong, China
  • fYear
    2013
  • fDate
    11-13 Dec. 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The spurious triggering pulse is an intrinsic feature in the gate-source voltage of the synchronous switch of the bridge-leg configuration. If it exceeds the threshold voltage of the switch, the spurious turn-on will occur and consequently incur excessive switching losses, self-oscillation and even shoot-through. This paper intends to establish a circuit-level analytical model of the synchronous buck converter considering all important parasitic elements and the reverse recovery characteristics of the body diode of the synchronous MOSFET to explore the underlying mechanism of the spurious triggering pulse. It is discovered that apart from the generally acknowledged Cdv/dt induced increase in the gate voltage, the Ldi/dt induced decease in the source voltage contributes to the pulse as well. Besides, the impact of the gate impedance of the synchronous MOSFET on this pulse depends on the dominance of these two factors. The analytical results will be verified by the experimental results of the prototype of a 40V/6A synchronous buck converter.
  • Keywords
    bridge circuits; power convertors; trigger circuits; bridge-leg configuration; circuit-level analytical model; gate-source voltage; reverse recovery characteristics; spurious triggering pulse; synchronous MOSFET; synchronous buck converter; synchronous switch; Analytical models; Impedance; Inductance; Logic gates; MOSFET; Switches; Threshold voltage; Cdv/dt induced turn-on; MOSFET; bridge-leg configuration; spurious turn-on;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Systems and Applications (PESA), 2013 5th International Conference on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4799-3276-4
  • Type

    conf

  • DOI
    10.1109/PESA.2013.6828236
  • Filename
    6828236