• DocumentCode
    686759
  • Title

    Non-uniform gamma ray event distribution in regionalized PET detector

  • Author

    Changlyong Kim ; Ito, Minora ; McDaniel, D.L.

  • Author_Institution
    GE Healthcare, Waukesha, WI, USA
  • fYear
    2013
  • fDate
    Oct. 27 2013-Nov. 2 2013
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    A TOF PET detector based on SiPM was developed for a PET-MR scanner. The detector optimization to achieve the best timing resolution, by balancing between the active area of SiPMs and the crystal block size, led to a regionalized flood map with three distinctive areas. With the flood map, we discovered that 511keV singles event distribution was non-uniform. The cause was found out to be due to Compton scatter events in the regionalized map. A Monte-Carlo simulation confirmed the observation and we also demonstrated that the uniform flood map yielded a uniform 511keV singles event distribution in the data. With the result, we concluded that the same applies to any regionalized or non-uniform flood map that can be manifested with DOI, PSAPD or SiPM detectors. They would show a non-uniform singles distribution when scintillation light is regionally isolated or any crystal region in a flood map is not equally distributed.
  • Keywords
    Compton effect; Monte Carlo methods; avalanche photodiodes; biomedical MRI; elemental semiconductors; optimisation; photomultipliers; positron emission tomography; silicon; Compton scatter events; DOI; Monte Carlo simulation; PET-MR scanner; PSAPD; SiPM; TOF PET detector; crystal block size; detector optimization; electron volt energy 511 keV; nonuniform gamma ray event distribution; positron emission tomography; regionalized PET detector; regionalized flood map; scintillation light; silicon photomultiplier; timing resolution; Anodes; Arrays; Crystals; Detectors; Floods; Positron emission tomography; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4799-0533-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2013.6829188
  • Filename
    6829188