• DocumentCode
    687053
  • Title

    Development of new ion beam monitor system using conductive mesh

  • Author

    Ito, Satoshi ; Matsuzaki, Hideaki ; Yasumoto, Masayoshi ; Morita, Akio

  • Author_Institution
    Sch. of Eng., Univ. of Tokyo, Tokyo, Japan
  • fYear
    2013
  • fDate
    Oct. 27 2013-Nov. 2 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A new beam monitor system wherein beam current and a beam shape can be monitored simultaneously was developed. This was accomplished by attaching conductive copper mesh on the fluorescent glass. The copper mesh not only provided the electric conductivity but also had effect to suppress secondary electron.
  • Keywords
    electrical conductivity; ion beams; particle beam diagnostics; beam current; beam shape; conductive copper mesh; electric conductivity; fluorescent glass; ion beam monitor system; secondary electron suppression; Current measurement; Fluorescence; Glass; Ion beams; Monitoring; Shape; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4799-0533-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2013.6829491
  • Filename
    6829491
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=687053