DocumentCode
68718
Title
64 x 48 TOF sensor in 0.35 spl mu/m CMOS with high ambient light immunity
Author
Davidovic, M. ; Seiter, J. ; Hofbauer, Michael ; Gaberl, Wolfgang ; Schidl, Stefan ; Zimmermann, Horst
Author_Institution
Inst. of Electrodynamics, Microwave & Circuit Eng., Vienna Univ. of Technol., Vienna, Austria
Volume
50
Issue
19
fYear
2014
fDate
September 11 2014
Firstpage
1375
Lastpage
1377
Abstract
A multi-pixel 64 × 48 time-of-flight (TOF) range sensor whose speciality is high immunity against ambient light is presented. The chip was fabricated in a 0.35 μm 1P4M CMOS process, whereby a single pixel occupies an area of 45 × 60 μm2 achieving a fill factor of 50%. The measured distance shows a 1σ deviation below 3.7 mm in the optimum operating range for the sensor. The measurement results show that the sensor successfully acquires the distance even when some parts of the scenery are illuminated with 180 klx ambient light. Furthermore, the most accurate method to characterise particular pixels in a multi-pixel array is for the first time used in a multi-pixel TOF sensor.
Keywords
CMOS image sensors; 1P4M CMOS process; fill factor; high ambient light immunity; high immunity against ambient light; multipixel 64×48 time-of-flight range sensor; multipixel TOF sensor; multipixel array; size 0.35 mum;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el.2014.2272
Filename
6898655
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