• DocumentCode
    68718
  • Title

    64 x 48 TOF sensor in 0.35 spl mu/m CMOS with high ambient light immunity

  • Author

    Davidovic, M. ; Seiter, J. ; Hofbauer, Michael ; Gaberl, Wolfgang ; Schidl, Stefan ; Zimmermann, Horst

  • Author_Institution
    Inst. of Electrodynamics, Microwave & Circuit Eng., Vienna Univ. of Technol., Vienna, Austria
  • Volume
    50
  • Issue
    19
  • fYear
    2014
  • fDate
    September 11 2014
  • Firstpage
    1375
  • Lastpage
    1377
  • Abstract
    A multi-pixel 64 × 48 time-of-flight (TOF) range sensor whose speciality is high immunity against ambient light is presented. The chip was fabricated in a 0.35 μm 1P4M CMOS process, whereby a single pixel occupies an area of 45 × 60 μm2 achieving a fill factor of 50%. The measured distance shows a 1σ deviation below 3.7 mm in the optimum operating range for the sensor. The measurement results show that the sensor successfully acquires the distance even when some parts of the scenery are illuminated with 180 klx ambient light. Furthermore, the most accurate method to characterise particular pixels in a multi-pixel array is for the first time used in a multi-pixel TOF sensor.
  • Keywords
    CMOS image sensors; 1P4M CMOS process; fill factor; high ambient light immunity; high immunity against ambient light; multipixel 64×48 time-of-flight range sensor; multipixel TOF sensor; multipixel array; size 0.35 mum;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2014.2272
  • Filename
    6898655