• DocumentCode
    687207
  • Title

    Crystal growth and luminescence properties of pure and Pr3+-doped NaGd(WO4)2 single crystals

  • Author

    Hua Jiang ; Rooh, Gul ; Kim, H.J. ; Lee, Jang M. ; Lee, Y.J. ; Khan, Sharifullah ; Kim, S.H.

  • Author_Institution
    Key Lab. of Particle & Radiat. Imaging, Tsinghua Univ., Beijing, China
  • fYear
    2013
  • fDate
    Oct. 27 2013-Nov. 2 2013
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    We have successfully grown pure and Pr3+-doped NaGd(WO4)2 (NGW) single crystals using the Czochralski pulling method. By employing a suitable rotation and pulling rates, good quality crystals of pure and Pr3+-doped NGW have been grown from the solution melt. Structural analyses of the grown samples are studied by X-ray diffraction (XRD). The x-ray induced emission spectrum shows a broad emission band in the wavelength range from 400 nm to 650 nm for the pure NGW crystal, while that of Pr3+-doped NGW crystal excited by X-ray was composed of eight bands. Emission spectrum of pure NGW crystal excited by 266 nm UV solid state laser was obtained at room temperature. The emission band includes two spectral regions: one consists of a wavelength band spanning 360 nm to 450 nm wavelengths peaking at 410 nm, and the other consists of a wavelength band spanning at 450 nm to 700 nm peaking at 530 nm, respectively.
  • Keywords
    X-ray diffraction; X-ray emission spectra; crystal growth from melt; gadolinium compounds; photoluminescence; praseodymium; sodium compounds; Czochralski pulling method; NaGd(WO4)2:Pr; UV solid state laser excitation; X-ray diffraction; X-ray induced emission spectrum; XRD; crystal growth; luminescence properties; single crystals; solution melt; structural analysis; wavelength 360 nm to 700 nm; wavelength band spanning; Crystals; Luminescence; Solid lasers; Temperature measurement; X-ray diffraction; X-ray scattering; Czochralski method; NaGd(WO4)2 crystal; luminescence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4799-0533-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2013.6829653
  • Filename
    6829653