Elimination of Artifacts in External Quantum Efficiency Measurements for Multijunction Solar Cells Using a Pulsed Light Bias

Author

Li, Jing-Jing ; Zhang, Yong-Hang

Author_Institution

Center for Photonics Innovation, Arizona State Univ., Tempe, AZ, USA

Volume

3

Issue

1

fYear

2013

fDate

Jan. 2013

Firstpage

364

Lastpage

369

Abstract

A method using a pulsed light bias synchronized to the probing monochromatic light and superimposed on the conventional dc light and voltage biases is proposed to eliminate the artifacts in external quantum efficiency (EQE) measurements for multijunction solar cells. It is demonstrated experimentally that this method effectively eliminates the EQE measurement artifacts caused by the shunt effect, the luminescence coupling effect, or their combination.

Keywords

luminescence; monochromators; solar cells; artifacts elimination; conventional dc light; external quantum efficiency measurements; luminescence coupling effect; monochromatic light; multijunction solar cells; pulsed light bias; shunt effect; voltage bias; Couplings; Current measurement; Indium gallium arsenide; Luminescence; Photoconductivity; Photovoltaic cells; Wavelength measurement; External quantum efficiency; luminescence coupling; measurement artifacts; multijunction solar cell; pulsed light bias; shunt;

fLanguage

English

Journal_Title

Photovoltaics, IEEE Journal of

Publisher

ieee

ISSN

2156-3381

Type

jour

DOI

10.1109/JPHOTOV.2012.2216512

Filename

6353868