Impact of low-frequency noise variability on statistical parameter extraction in ultra-scaled CMOS devices

Author

Ioannidis, E.G. ; Theodorou, C.G. ; Haendler, S. ; Dimitriadis, C.A. ; Ghibaudo, Gerard

Author_Institution

LAHC Lab. at Minatec, IMEP, Grenoble, France

Volume

50

Issue

19

fYear

2014

fDate

September 11 2014

Firstpage

1393

Lastpage

1395

Abstract

The impact on the extracted low-frequency noise (LFN) parameter values due to LFN variability in CMOS devices is investigated. First, it is demonstrated that the noise level dispersion follows a log normal statistical distribution. Then, based on this feature, it is explained why the mean values from the linear data are different from the mean values (or median values) calculated from the log noise data. Finally, the consequence of this finding in terms of LFN characterisation issues and Monte Carlo LFN variability circuit simulation is discussed.

Keywords

CMOS integrated circuits; Monte Carlo methods; circuit simulation; log normal distribution; LFN characterisation issues; Monte Carlo variability circuit simulation; linear data; log noise data; log normal statistical distribution; low-frequency noise variability; mean values; median values; noise level dispersion; statistical parameter extraction; ultra-scaled CMOS devices;

fLanguage

English

Journal_Title

Electronics Letters

Publisher

iet

ISSN

0013-5194

Type

jour

DOI

10.1049/el.2014.1837

Filename

6898665