DocumentCode :
688314
Title :
Reliability Analysis of Energy-Efficient Parallel Storage Systems
Author :
Shu Yin ; Kenli Li ; Xiao Qin ; Xiaojun Ruan ; Haiquan Chen ; Jiong Xie ; Xiaomin Zhu
Author_Institution :
Sch. of Inf. Sci. & Eng., Hunan Univ., Changsha, China
fYear :
2013
fDate :
13-15 Nov. 2013
Firstpage :
1448
Lastpage :
1455
Abstract :
Existing reliability models evaluate the lifetime of storage systems well. However, few models aim to analysis parallel storage systems, especially systems equipped with energy-efficient solutions. MREED model provides an inspiring reliability analysis idea for energy-efficient parallel storage systems, especially RAIDs. Unfortunately, the MREED has its disadvantage that it can evaluate RAID-0 only, in which a basic method of data-stripping is applied. In this paper, we extend the MREED model to cover the most energy-efficient RAID setups including RAID-1, which introduces disk-mirroring techniques, and RAID-5, which applies a data-parity techniques based on data-stripping schemes for a data recovery purpose. The MREED is then applied to evaluate an existing well-known power-aware RAID system-PARAID. Experimental results indicate the data locality affection and data parity impaction on the reliability of PARAID. Furthermore, we investigate a fundamental trade-off between reliability and energy-efficiency in terms of energy-saving RAID systems. A tradeoff curve is provided to justify whether it worth to sacrifice reliability for better energy efficiency.
Keywords :
energy conservation; parallel processing; reliability; storage management; MREED model; PARAID; RAID-1; RAID-5; data locality affection; data parity impaction; data recovery purpose; data-parity techniques; data-stripping; disk-mirroring techniques; energy-efficient RAID setups; energy-efficient parallel storage systems; power-aware RAID system; reliability analysis; storage system lifetime; tradeoff curve; Arrays; Educational institutions; Energy storage; Gears; Reliability; Spinning; Temperature; Energy-Efficient; Parallel Storage System; RAID; Reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Performance Computing and Communications & 2013 IEEE International Conference on Embedded and Ubiquitous Computing (HPCC_EUC), 2013 IEEE 10th International Conference on
Conference_Location :
Zhangjiajie
Type :
conf
DOI :
10.1109/HPCC.and.EUC.2013.205
Filename :
6832087
Link To Document :
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