Title :
Linewidth measurement of 1550 nm high contrast grating MEMS-VCSELs
Author :
Weijian Yang ; Yi Rao ; Chase, Chris ; Huang, M.C.Y. ; Chang-Hasnain, Connie J.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, Berkeley, CA, USA
Abstract :
A new measurement scheme to characterize MEMS-VCSEL linewidths is demonstrated. Linewidth in the range of 40~60MHz is measured for 1550-nm high contrast grating VCSELs. We identify key contributors of the Brownian-motion-induced broadening for future optimization.
Keywords :
laser variables measurement; microcavity lasers; micromechanical resonators; spectral line breadth; surface emitting lasers; Brownian-motion-induced broadening; frequency 40 MHz to 60 MHz; high-contrast grating MEMS-VCSEL linewidth measurement; vertical-cavity surface-emitting laser; wavelength 1550 nm; Delays; Fiber lasers; Measurement by laser beam; Micromechanical devices; Mirrors; Vertical cavity surface emitting lasers;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2013 Conference on
Conference_Location :
San Jose, CA
