DocumentCode
689935
Title
Near-infrared characterization of ENABLE grown superconducting nanowire single photon detectors
Author
Sandberg, R.L. ; Weisse-Bernstein, Nina R. ; Croce, Mark P. ; Williamson, Todd L. ; Hoffbauer, Mark A. ; Holesinger, Terry G. ; Rabin, Michael W.
Author_Institution
Mater. Phys. & Applic. Div., Center for Integrated Nanotechnol., Los Alamos, NM, USA
fYear
2013
fDate
9-14 June 2013
Firstpage
1
Lastpage
2
Abstract
We characterize the near-infrared response of superconducting nanowire single photon detectors grown with the Energetic Neutral Atom Beam Lithography&Epitaxy technique. These SNSPDs show single photon sensitivity, MHz count rate, low-timing jitter, and detection efficiency ~10-3.
Keywords
lithography; molecular beam epitaxial growth; nanowires; niobium compounds; photon counting; superconducting photodetectors; timing jitter; ENABLE grown superconducting nanowire single photon detectors; MHz count rate; NbN; SNSPD; detection efficiency; energetic neutral atom beam lithography; epitaxial growth; low-timing jitter; near-infrared characterization; near-infrared response; single photon sensitivity; Detectors; Nanoscale devices; Photonics; Plasma temperature; Superconducting epitaxial layers; Superconducting photodetectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics (CLEO), 2013 Conference on
Conference_Location
San Jose, CA
Type
conf
Filename
6834325
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