• DocumentCode
    69023
  • Title

    Measurement Techniques for RF Nanoelectronics [From the Guest Editors´ Desk]

  • Author

    Wallis, T. Mitch ; Pierantoni, Luca

  • Volume
    15
  • Issue
    1
  • fYear
    2014
  • fDate
    Jan.-Feb. 2014
  • Firstpage
    26
  • Lastpage
    28
  • Abstract
    The articles in this special section focus on measurement techniques for radio frequency nanoelectronic devices.
  • Keywords
    Microwave imaging; Microwave measurement; Microwave transistors; Nanoelectronics; Radio frequency; Special issues and sections;
  • fLanguage
    English
  • Journal_Title
    Microwave Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1527-3342
  • Type

    jour

  • DOI
    10.1109/MMM.2013.2292758
  • Filename
    6717144
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=69023