Title :
Linear angle sensitive pixels for 4D light field capture
Author :
Varghese, Vigil ; Xinyuan Qian ; Shoushun Chen ; Shen ZeXiang
Author_Institution :
VIRTUS IC Design Centre of Excellence, Nanyang Technol. Univ., Singapore, Singapore
Abstract :
In this paper we present the design of an image sensor pixel which produces a linear response proportional to the incident light angle. Unlike conventional pixels, the proposed pixel encodes incident angles in terms of linear intensity variations. A set of four pixels can distinguish between incident light angles along both the vertical and horizontal directions. This coarse linear angle information can be combined with the precise nonlinear Talbot effect based pixel response to deduce the exact incident angle. This technique greatly reduces the complexity of the Talbot effect based technique. Fabricated in a 65 nm Global Foundries mixed-signal CMOS process, the sensor can distinguish between angles in the range from -35°C to +35°C.
Keywords :
CMOS image sensors; Talbot effect; mixed analogue-digital integrated circuits; 4D light field capture; coarse linear angle information; conventional pixels; global foundries mixed-signal CMOS process; horizontal directions; image sensor pixel; incident light angle; linear angle sensitive pixels; linear intensity variations; linear response; nonlinear Talbot effect; size 65 nm; temperature -35 degC to 35 degC; vertical directions; Dielectrics; Gratings; Image sensors; Metals; Photodiodes; Sensitivity; Talbot effect; Angle detection; image sensor; linear angle sensitive pixels;
Conference_Titel :
SoC Design Conference (ISOCC), 2013 International
Conference_Location :
Busan
DOI :
10.1109/ISOCC.2013.6863988