Title :
Low-power, low-storage-overhead chipkill correct via multi-line error correction
Author :
Xun Jian ; Duwe, Henry ; Sartori, John ; Sridharan, Vilas ; Kumar, Ravindra
Author_Institution :
Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Abstract :
Due to their large memory capacities, many modern servers require chipkill correct, an advanced type of memory error detection and correction, to meet their reliability requirements. However, existing chipkill-correct solutions incur high power or storage overheads, or both because they use dedicated error-correction resources per codeword to perform error correction. This requires high overhead for correction and results in high overhead for error detection. We propose a novel chipkill-correct solution, multi-line error correction, that uses resources shared across multiple lines in memory for error correction to reduce the overhead of both error detection and correction. Our evaluations show that the proposed solution reduces memory power by a mean of 27%, and up to 38% with respect to commercial solutions, at a cost of 0.4% increase in storage overhead and minimal impact on reliability.
Keywords :
DRAM chips; error correction; error detection; integrated circuit reliability; low-power electronics; storage management; DRAM device; dedicated error-correction resources per codeword; low-power low-storage-overhead chipkill correct solution; memory error detection; multiline error correction; reliability; storage overheads; Error correction; Error correction codes; Maximum likelihood decoding; Maximum likelihood detection; Memory management; Reliability; Servers;
Conference_Titel :
High Performance Computing, Networking, Storage and Analysis (SC), 2013 International Conference for
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4503-2378-9
DOI :
10.1145/2503210.2503243