Research on SRAM-based FPGA SEE sensitive parameters fast estimation method

Sensitive parameters (function error rate and mean time to failure (MTTF)) estimation for SRAM-based FPGA Single Event Effect (SEE) has been a very active area of research for recent years. Since the existed methods are time-consuming and costly, a fast estimation method based on fault injection has been proposed to reduce the estimation time. By compressing the fault set, reducing fault injection time and estimating fault response time, the sensitive parameters estimation time has been decreased effectively. The results of the method analysis show that the method this paper proposed can solved the issue of time explosion commendably and obtain accurate target parameters. At present, this method has been applied to the design of a digital signal processing platform in satellite.