DocumentCode
693078
Title
Study and comparison of two automatic identification methods on spectrums captured by X-ray fluorescence spectrometers with LABVIEW
Author
Jiening Xia ; Zhigao Chen
Author_Institution
Hubei Key Lab. of Earthquake Early Warning, Wuhan Base of Inst. of Crustal Dynamics, Wuhan, China
fYear
2013
fDate
20-22 Dec. 2013
Firstpage
3687
Lastpage
3691
Abstract
The way to improve the accuracy and reliability of automatic unscrambling and identification technology on X-ray fluorescence spectrometer spectrum is studied in this essay. Accordingly, two different automatic identification methods based on Fast Fourier Transform and Wavelet Transform are presented. By the tool LABVIEW, such two methods are applied to the qualitative analysis on X-ray fluorescence spectrums, and the features of such two methods are compared. Based on the experiments and analysis on hundreds of samples, it can be concluded that the automatic identification method based on the Wavelet transform theory is better than the other method for the former has a better local resolution. Therefore, the characteristic values of the singular points are more clearly recognized by the method based on the Wavelet transform. Through the study in this essay, theories on automatic identification are enriched, which set a foundation for further studied in future.
Keywords
X-ray fluorescence analysis; X-ray spectrometers; fast Fourier transforms; identification technology; virtual instrumentation; wavelet transforms; LABVIEW; X- ray fluorescence spectrometer spectrum; automatic identification methods; automatic unscrambling; fast fourier transform; identification technology; qualitative analysis; wavelet transform theory; Fast Fourier transforms; Fluorescence; Materials; Wavelet analysis; Wavelet transforms; Fast Fourier Transform; LABVIEW; X-ray fluorescence spectrometer; spectrum identification; wavelet transform;
fLanguage
English
Publisher
ieee
Conference_Titel
Mechatronic Sciences, Electric Engineering and Computer (MEC), Proceedings 2013 International Conference on
Conference_Location
Shengyang
Print_ISBN
978-1-4799-2564-3
Type
conf
DOI
10.1109/MEC.2013.6885637
Filename
6885637
Link To Document