• DocumentCode
    693078
  • Title

    Study and comparison of two automatic identification methods on spectrums captured by X-ray fluorescence spectrometers with LABVIEW

  • Author

    Jiening Xia ; Zhigao Chen

  • Author_Institution
    Hubei Key Lab. of Earthquake Early Warning, Wuhan Base of Inst. of Crustal Dynamics, Wuhan, China
  • fYear
    2013
  • fDate
    20-22 Dec. 2013
  • Firstpage
    3687
  • Lastpage
    3691
  • Abstract
    The way to improve the accuracy and reliability of automatic unscrambling and identification technology on X-ray fluorescence spectrometer spectrum is studied in this essay. Accordingly, two different automatic identification methods based on Fast Fourier Transform and Wavelet Transform are presented. By the tool LABVIEW, such two methods are applied to the qualitative analysis on X-ray fluorescence spectrums, and the features of such two methods are compared. Based on the experiments and analysis on hundreds of samples, it can be concluded that the automatic identification method based on the Wavelet transform theory is better than the other method for the former has a better local resolution. Therefore, the characteristic values of the singular points are more clearly recognized by the method based on the Wavelet transform. Through the study in this essay, theories on automatic identification are enriched, which set a foundation for further studied in future.
  • Keywords
    X-ray fluorescence analysis; X-ray spectrometers; fast Fourier transforms; identification technology; virtual instrumentation; wavelet transforms; LABVIEW; X- ray fluorescence spectrometer spectrum; automatic identification methods; automatic unscrambling; fast fourier transform; identification technology; qualitative analysis; wavelet transform theory; Fast Fourier transforms; Fluorescence; Materials; Wavelet analysis; Wavelet transforms; Fast Fourier Transform; LABVIEW; X-ray fluorescence spectrometer; spectrum identification; wavelet transform;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mechatronic Sciences, Electric Engineering and Computer (MEC), Proceedings 2013 International Conference on
  • Conference_Location
    Shengyang
  • Print_ISBN
    978-1-4799-2564-3
  • Type

    conf

  • DOI
    10.1109/MEC.2013.6885637
  • Filename
    6885637