• DocumentCode
    693376
  • Title

    A 400nW CMOS bandgap voltage reference

  • Author

    Far, Ali

  • fYear
    2013
  • fDate
    4-5 Dec. 2013
  • Firstpage
    15
  • Lastpage
    20
  • Abstract
    A resistorless 400 nano-Watts bandgap voltage reference in standard 0.25μ digital CMOS process is presented. Parasitic vertical bipolar transistors (BJT) are used to generate a series of cascaded thermal voltages (VT), which is summed with a base-emitter voltage (VBE) to produce a ~1.25V bandgap voltage (VBG). Statistical contributions of CMOS amplifiers´ inherent random noise, offset, and drift terms to the VBG are not multiplied but rather accumulated by the square root of number of additions, fundamentally because the proposed configuration uses summation and not multiplication to generate the bandgap´s proportional to absolute temperature (PTAT) term. Such a bandgap can operate at ultra-low currents (i.e. nano-amperes) without using (large size) resistors, which saves significant die area. This design does not require special transistors, and it does not stack parasitic BJTs that could impose VDD headroom constraints. Furthermore, the design does not use multi-staged (special hybrid or) CMOS voltage followers with built-in offset voltage to generate pseudo-PTAT voltage. Therefore, manufacturability and portability across different process nodes at standard CMOS foundries is optimized. Monte Carlo simulations and analysis demonstrates that a temperature coefficient (TC) of about ±50 ppm/°C over a 200°C temperature range can be achievable, and voltage coefficient of about ±0.2% / V with VDD spanning 1.5V to 4.5V can be realized.
  • Keywords
    CMOS digital integrated circuits; Monte Carlo methods; amplifiers; bipolar transistors; foundries; integrated circuit noise; low-power electronics; random noise; reference circuits; BJT; CMOS bandgap voltage reference; Monte Carlo simulations; cascaded thermal voltages; digital CMOS process; low power bandgap; parasitic vertical bipolar transistors; power 400 nW; random noise; size 0.25 mum; standard CMOS foundries; voltage 1.5 V to 4.5 V; CMOS integrated circuits; Noise; Photonic band gap; Resistors; Semiconductor device modeling; Temperature distribution; Transistors; CMOS reference voltage; bandgap; energy harvesting; extended temperature range; low power; low voltage; no resistor; reference; regulator; resistorless; subthreshold; ultra low power; wide power supply range;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical, Electronics and System Engineering (ICEESE), 2013 International Conference on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-1-4799-3177-4
  • Type

    conf

  • DOI
    10.1109/ICEESE.2013.6895035
  • Filename
    6895035