Title :
A Test Procedure for Investigating Hot Spots in Upgraded Metallurgical Grade Silicon (UMG-Si) Photovoltaic (PV) Modules
Author :
Bahaidra, Esam S. ; Alamoud, Abdulrahman M.
Author_Institution :
Dept. of Electr. Eng., King Saud Univ., Riyadh, Saudi Arabia
Abstract :
A study is presented to investigate the effect of hot spot on Upgraded metallurgical grade silicon (UMG-Si) Photovoltaic and on modules. These modules are designed and fabricated based on cells with different breakdown voltage. The procedure of testing is applied to show the performance of modules for the worst case hot spot condition by using outdoor testing and infrared (IR) camera. This test procedure implements international standards of testing PV modules for hot spots with adaptation to the Kingdom of Saudi Arabia (KSA) environment where necessary. The behavior of modules is compared and studied at different situation to know if this type of material is appropriate for photovoltaic applications in the KSA.
Keywords :
cameras; electric breakdown; elemental semiconductors; infrared detectors; integrated circuit testing; silicon; solar cells; IR camera; KSA environment; Kingdom of Saudi Arabia environment; UMG-silicon PV; breakdown voltage; infrared camera; international standards; outdoor testing; test procedure; upgraded metallurgical grade silicon photovoltaic modules; worst case hot spot condition; Photovoltaic cells; Photovoltaic systems; Silicon; Sun; Testing; Hot Spots; Infrared; Photovoltaic; UMG-Si;
Conference_Titel :
Artificial Intelligence, Modelling and Simulation (AIMS), 2013 1st International Conference on
Conference_Location :
Kota Kinabalu
Print_ISBN :
978-1-4799-3250-4
DOI :
10.1109/AIMS.2013.68
