DocumentCode
69732
Title
CDM Tester Properties as Deduced From Waveforms
Author
Maloney, Timothy J. ; Jack, Nathan
Author_Institution
Intel Corp., Santa Clara, CA, USA
Volume
14
Issue
3
fYear
2014
fDate
Sept. 2014
Firstpage
792
Lastpage
800
Abstract
Two-pole resistance-inductance-capacitance (RLC) models, matching peak current and charge under the first current peak, are shown to fit charged device model (CDM) waveforms well, as they target features that cause device failure. The effect of oscilloscope filtering on the waveform can also be assessed. RLC properties of ferrites, air sparks, varying dielectric, and other tester elements become clear and point us to a revised CDM test standard.
Keywords
RLC circuits; ferrites; test equipment; CDM tester properties; RLC models; air sparks; charged device model waveforms; ferrites; oscilloscope filtering; two-pole resistance-inductance-capacitance models; varying dielectric; Dielectrics; Electronics packaging; Integrated circuit modeling; Market research; Oscilloscopes; Sparks; Standards; Electrostatic discharge (ESD); Laplace transforms; charged device model (CDM); circuit models; oscilloscope modeling; step response;
fLanguage
English
Journal_Title
Device and Materials Reliability, IEEE Transactions on
Publisher
ieee
ISSN
1530-4388
Type
jour
DOI
10.1109/TDMR.2014.2316177
Filename
6784485
Link To Document