Model-Based Test Case Generation by Reusing Models From Runtime Monitoring of Deeply Embedded Systems

Author

Iyenghar, P. ; Wuebbelmann, J. ; Westerkamp, Clemens ; Pulvermueller, E.

Author_Institution

Dept. of Math. & Comput. Sci., Software Eng. Group, Univ. of Osnabruck, Osnabruck, Germany

Volume

5

Issue

3

fYear

2013

fDate

Sept. 2013

Firstpage

38

Lastpage

41

Abstract

This letter introduces a novel application of model-based runtime monitoring of deeply embedded systems. The proposed framework comprises of a minimally intrusive, generic, software-based, runtime monitoring methodology for visualizing the behavior of deeply embedded systems in real-time. The model-based runtime monitoring results are then reused for generating model-based test cases. A prototype implementation of the proposed framework is discussed along with examples.

Keywords

embedded systems; program testing; software reusability; deeply embedded system; model reuse; model-based runtime monitoring; model-based test case generation; runtime monitoring methodology; Computers; Embedded systems; Monitoring; Prototypes; Runtime; Unified modeling language; Deeply embedded systems; UML; model-based runtime monitoring; reusing models; test case generation;

fLanguage

English

Journal_Title

Embedded Systems Letters, IEEE

Publisher

ieee

ISSN

1943-0663

Type

jour

DOI

10.1109/LES.2013.2264502

Filename

6517885