Title :
What do quality measures predict in biometrics?
Author :
Kryszczuk, Krzysztof ; Drygajlo, Andrzej
Author_Institution :
IBM Zurich Res. Lab., Rüschlikon, Switzerland
Abstract :
This paper is discusses the role of quality measures in biometric classification. We challenge a common notion that quality measures are performance predictors of the baseline biometric classifier. Instead, we postulate that quality measures are class-independent classification features, and as such are conditionally relevant class predictors. We present a systematic, probabilistic approach towards error prediction in biometric classification systems, where quality measures play an integral role in a stacked classifier ensemble. We demonstrate the results of error prediction in face verification using the proposed method.
Keywords :
biometrics (access control); face recognition; feature extraction; image classification; baseline biometrics; biometric classification; class predictors; class-independent classification features; error prediction; face verification; performance predictors; quality measures; Abstracts; Biometrics (access control);
Conference_Titel :
Signal Processing Conference, 2008 16th European
Conference_Location :
Lausanne