DocumentCode
700155
Title
Two denoising SURE-LET methods for complex oversampled subband decompositions
Author
Gauthier, Jerome ; Duval, Laurent ; Pesquet, Jean-Christophe
Author_Institution
Inst. Gaspard Monge, Univ. Paris-Est, Marne-La-Vallée, France
fYear
2008
fDate
25-29 Aug. 2008
Firstpage
1
Lastpage
5
Abstract
Redundancy in wavelets and filter banks has the potential to greatly improve signal and image denoising. Having developed a framework for optimized oversampled complex lapped transforms, we propose their association with the statistically efficient Stein´s principle in the context of mean square error estimation. Under Gaussian noise assumptions, expectations involving the (unknown) original data are expressed using the observation only. Two forms of Stein´s Unbiased Risk Estimators, derived in the coefficient and the spatial domain respectively, are proposed, the latter being more computationally expensive. These estimators are then employed for denoising with linear combinations of elementary threshold functions. Their performances are compared to the oracle, and addressed with respect to the redundancy. They are finally tested against other denoising algorithms. They prove competitive, yielding especially good results for texture preservation.
Keywords
Gaussian noise; channel bank filters; image denoising; mean square error methods; wavelet transforms; Gaussian noise assumptions; SURE-LET methods; Stein principle; Stein unbiased risk estimators; complex oversampled subband decompositions; elementary threshold functions; filter banks; image denoising; mean square error estimation; optimized oversampled complex lapped transforms; signal denoising; spatial domain; wavelet redundancy; Estimation; Minimization; Noise measurement; Noise reduction; Redundancy; Transforms; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Signal Processing Conference, 2008 16th European
Conference_Location
Lausanne
ISSN
2219-5491
Type
conf
Filename
7080687
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