• DocumentCode
    70081
  • Title

    I V Characteristics of Antiparallel Resistive Switches Observed in a Single

  • Author

    Liu, Tong ; Verma, Mohini ; Kang, Yuhong ; Orlowski, Marius K.

  • Author_Institution
    Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • Volume
    34
  • Issue
    1
  • fYear
    2013
  • fDate
    Jan. 2013
  • Firstpage
    108
  • Lastpage
    110
  • Abstract
    A Cu/TaOx/Pt resistive cell can transition from a high-resistance state to a low-resistance state by applying positive or negative set voltages. The set operation with positive bias is due to the electrochemical formation of a Cu conductive filament (CF), whereas the set operation with negative bias is attributed to the electroreduction of solid electrolyte and formation of an oxygen vacancy VOCF. Both CFs can be reset by Joule heating. Since set voltages of the VOCF have higher absolute values than those of the Cu CF, the switching based on Cu and VO CFs can be decoupled within the same device. The device is inherently an antiparallel resistive switch circuit that can be consecutively switched between the Cu and VOCFs.
  • Keywords
    switches; Joule heating; antiparallel resistive switch circuit; antiparallel resistive switches; conductive filament; electrochemical formation; electroreduction; high resistance state; low resistance state; negative bias; negative set voltage; oxygen vacancy; positive set voltage; resistive cell; solid electrolyte; Electrodes; Memristors; Metals; Solids; Switches; Temperature measurement; Voltage measurement; Antiparallel resistive switch (APS); conductive filament (CF); oxygen vacancy;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2012.2222631
  • Filename
    6355612