Title :
Large-scale multi-corner leakage optimization under the sign-off timing environment
Author :
Gonzalez, George ; Mani, Murari ; Sharma, Mahesh
Author_Institution :
Adv. Micro Devices, Austin, TX, USA
Abstract :
In this paper, we present an efficient algorithm for large-scale leakage optimization under sign-off timing constraints using the technique of multiple voltage threshold (multi-Vt) assignment. Several practical considerations are addressed, such as the synergistic propagation of swaps across all sign-off timing corners, iterative application of block-level and interface logic model (ILM)-level swap lists, and mitigation of hold-timing violations. The algorithm has been deployed successfully for performance-per-watt improvement on several SoC designs containing both CPU and GPU cores. It enables an average of ~10% improvement in leakage compared to current state-of-the-art vendor solutions.
Keywords :
graphics processing units; integrated circuit design; logic design; microprocessor chips; system-on-chip; CPU; GPU; SoC designs; interface logic model; large-scale leakage optimization; large-scale multi-corner leakage optimization; multiple voltage threshold assignment; sign-off timing constraints; sign-off timing environment; Algorithm design and analysis; Delays; Linear programming; Logic gates; Optimization; Threshold voltage;
Conference_Titel :
Quality Electronic Design (ISQED), 2015 16th International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4799-7580-8
DOI :
10.1109/ISQED.2015.7085395