• DocumentCode
    702279
  • Title

    Optimal choice of FinFET devices for energy minimization in deeply-scaled technologies

  • Author

    Abrishami, Mohammad Saeed ; Shafaei, Alireza ; Yanzhi Wang ; Pedram, Massoud

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA, USA
  • fYear
    2015
  • fDate
    2-4 March 2015
  • Firstpage
    234
  • Lastpage
    238
  • Abstract
    FinFET devices are considered to be the device substitute for bulk CMOS in sub-20nm technology nodes due to the reduced short-channel effects, improved ON/OFF current ratio, and improved voltage scalability. This paper investigates the problem of optimal selection of deeply-scaled FinFET technology to achieve minimum energy consumption for different applications such as sensor applications, smartphones, embedded micro-processors, or server micro-processors, which differ in the required performance and duty ratio. For each application space, different FinFET technologies (with different Vth and gate length biases) are compared in term of minimum energy consumption for both logic circuits and cache memories. A device-circuit-architecture cross-layer framework has been developed to facilitate this technology selection. This optimal technology selection procedure demonstrates up to 11× energy saving compared to poorly selected technologies.
  • Keywords
    CMOS integrated circuits; MOSFET; integrated circuit design; low-power electronics; FinFET devices; bulk CMOS; cache memories; deeply-scaled technologies; device-circuit-architecture cross-layer framework; embedded microprocessors; logic circuits; sensor applications; server microprocessors; short-channel effects; smartphones; voltage scalability; CMOS integrated circuits; Cache memory; Energy consumption; FinFETs; Integrated circuit modeling; Logic gates; Performance evaluation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2015 16th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    978-1-4799-7580-8
  • Type

    conf

  • DOI
    10.1109/ISQED.2015.7085431
  • Filename
    7085431