• DocumentCode
    702303
  • Title

    Fault-tolerant methods for a new lightweight cipher SIMON

  • Author

    Dofe, Jaya ; Reed, Connor ; Ning Zhang ; Qiaoyan Yu

  • Author_Institution
    Electr. & Comput. Eng. Dept., Univ. of New Hampshire, Durham, NH, USA
  • fYear
    2015
  • fDate
    2-4 March 2015
  • Firstpage
    460
  • Lastpage
    464
  • Abstract
    We propose three fault-tolerant methods for a new lightweight block cipher SIMON, which has the potential to be a hardware-efficient security primitive for embedded systems. As a single fault in the encryption (decryption) process can completely change the ciphertext (received plaintext), it is critical to ensure the reliability of encryption and decryption modules. We explore double-modular redundancy (DMR), reverse function, and a parity check code combined with a non-linear compensation function (EPC) to detect faults in SIMON. The proposed fault-tolerant methods were implemented in iterative and pipelined SIMON architectures. The corresponding hardware cost, power consumption, and fault detection failure rate were assessed. Simulation results show that EPC-SIMON consumes less area and power than DMR-SIMON and Reversed-SIMON but yields a higher fault detection failure rate as the number of concurrent faults increases. Moreover, our experiments show that the impact of fault location on the fault-detection failure rates for different methods is not consistent.
  • Keywords
    cryptography; embedded systems; fault diagnosis; fault tolerant computing; parity check codes; DMR-SIMON; EPC-SIMON; ciphertext; concurrent faults; decryption modules; decryption process; double-modular redundancy; embedded systems; encryption modules; encryption process; fault detection failure rate; fault location; fault-tolerant methods; hardware cost; hardware-efficient security primitive; iterative SIMON architectures; lightweight block cipher; nonlinear compensation function; parity check code; pipelined SIMON architectures; plaintext; power consumption; reverse function; reversed-SIMON; Ciphers; Circuit faults; Fault detection; Fault tolerance; Fault tolerant systems; Parity check codes; Schedules; SIMON; block cipher; fault tolerance; reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2015 16th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    978-1-4799-7580-8
  • Type

    conf

  • DOI
    10.1109/ISQED.2015.7085469
  • Filename
    7085469