DocumentCode :
702303
Title :
Fault-tolerant methods for a new lightweight cipher SIMON
Author :
Dofe, Jaya ; Reed, Connor ; Ning Zhang ; Qiaoyan Yu
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of New Hampshire, Durham, NH, USA
fYear :
2015
fDate :
2-4 March 2015
Firstpage :
460
Lastpage :
464
Abstract :
We propose three fault-tolerant methods for a new lightweight block cipher SIMON, which has the potential to be a hardware-efficient security primitive for embedded systems. As a single fault in the encryption (decryption) process can completely change the ciphertext (received plaintext), it is critical to ensure the reliability of encryption and decryption modules. We explore double-modular redundancy (DMR), reverse function, and a parity check code combined with a non-linear compensation function (EPC) to detect faults in SIMON. The proposed fault-tolerant methods were implemented in iterative and pipelined SIMON architectures. The corresponding hardware cost, power consumption, and fault detection failure rate were assessed. Simulation results show that EPC-SIMON consumes less area and power than DMR-SIMON and Reversed-SIMON but yields a higher fault detection failure rate as the number of concurrent faults increases. Moreover, our experiments show that the impact of fault location on the fault-detection failure rates for different methods is not consistent.
Keywords :
cryptography; embedded systems; fault diagnosis; fault tolerant computing; parity check codes; DMR-SIMON; EPC-SIMON; ciphertext; concurrent faults; decryption modules; decryption process; double-modular redundancy; embedded systems; encryption modules; encryption process; fault detection failure rate; fault location; fault-tolerant methods; hardware cost; hardware-efficient security primitive; iterative SIMON architectures; lightweight block cipher; nonlinear compensation function; parity check code; pipelined SIMON architectures; plaintext; power consumption; reverse function; reversed-SIMON; Ciphers; Circuit faults; Fault detection; Fault tolerance; Fault tolerant systems; Parity check codes; Schedules; SIMON; block cipher; fault tolerance; reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2015 16th International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4799-7580-8
Type :
conf
DOI :
10.1109/ISQED.2015.7085469
Filename :
7085469
Link To Document :
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