• DocumentCode
    704027
  • Title

    TAPP: Temperature-aware application mapping for NoC-based many-core processors

  • Author

    Di Zhu ; Lizhong Chen ; Pinkston, Timothy M. ; Pedram, Massoud

  • Author_Institution
    Ming Hsieh Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA, USA
  • fYear
    2015
  • fDate
    9-13 March 2015
  • Firstpage
    1241
  • Lastpage
    1244
  • Abstract
    Application mapping with its ability to spread out high-power components can potentially be a good approach to mitigate the looming issue of hotspots in many-core processors. However, very few works have explored effective ways of making tradeoff between temperature and network latency. Moreover, on-chip routers, which are of high power density and may lead to hotspots, are not considered in these works. In this paper, we propose TAPP (Temperature-Aware Partitioning and Placement), an efficient application mapping algorithm to reduce on-chip hotspots while sacrificing little network performance. This algorithm “spreads” high-power cores and routers across the chip by performing hierarchical bi-partitioning of the cores and concurrently conducting placement of the cores onto tiles, and achieves high efficiency and superior scalability. Simulation results show that the proposed algorithm reduces the temperature by up to 6.80°C with minimal latency increase compared to the latency-oriented mapping solution.
  • Keywords
    multiprocessing systems; network routing; network-on-chip; NoC-based many-core processor; TAPP; hierarchical bipartitioning; high-power component; latency-oriented mapping solution; network latency; on-chip hotspot reduction; on-chip router; power density; temperature-aware application mapping; temperature-aware partitioning and placement; Algorithm design and analysis; Benchmark testing; Computer architecture; Heuristic algorithms; Partitioning algorithms; Power demand; System-on-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
  • Conference_Location
    Grenoble
  • Print_ISBN
    978-3-9815-3704-8
  • Type

    conf

  • Filename
    7092579