DocumentCode :
704088
Title :
May-happen-in-parallel analysis of ESL models using UPPAAL model checking
Author :
Che-Wei Chang ; Domer, Rainer
Author_Institution :
Center for Embedded Comput. Syst., Univ. of California, Irvine, Irvine, CA, USA
fYear :
2015
fDate :
9-13 March 2015
Firstpage :
1567
Lastpage :
1570
Abstract :
In this paper, we propose an approach for May-Happen-in-Parallel (MHP) analysis of electronic system level (ESL) design which models parallel discrete event simulation with concurrent automaton processes and formally identify those MHP states. Our MHP analysis utilizes formal verification by use of the UPPAAL model checker. The proposed approach converts the system model in SpecC SLDL into an UPPAAL model and generates a set of queries that automatically and completely finds all possible MHP pairs. The experimental results show our approach can report more precise MHP analysis results compared to other works at the cost of extended analysis run time.
Keywords :
discrete event simulation; electronic engineering computing; formal verification; parallel processing; ESL model; MHP analysis; SpecC SLDL; UPPAAL model checker; UPPAAL model checking; concurrent automaton process; electronic system level design; formal verification; may-happen-in-parallel analysis; parallel discrete event simulation; Analytical models; Automata; Computational modeling; Generators; Optimization; Semantics; Transform coding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
Conference_Location :
Grenoble
Print_ISBN :
978-3-9815-3704-8
Type :
conf
Filename :
7092640
Link To Document :
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