• DocumentCode
    70658
  • Title

    A White-Light Interferometry for the Measurement of High-Finesse Fiber Optic EFPI Sensors

  • Author

    Wang, Zhen ; Jiang, Yizhang ; Ding, Wei-Ping ; Gao, Ran

  • Author_Institution
    School of Opto-Electronics, Beijing Institute of Technology, Beijing, China
  • Volume
    26
  • Issue
    21
  • fYear
    2014
  • fDate
    Nov.1, 1 2014
  • Firstpage
    2138
  • Lastpage
    2141
  • Abstract
    A white-light interferometry based on the Fourier transform method is proposed to measure the optical path difference (OPD) of the high-finesse fiber optic extrinsic Fabry–Pérot interferometric (EFPI) sensor. The Fourier spectrum of the transmission spectrum signal consists of multiple frequency components because of the multiple-beam interference occurring in the high-finesse EFPI sensor. The high-order frequency component of the Fourier spectrum can be extracted by the Fourier transform method to recover the OPD in order to overcome the spectrum overlapping, which happens when the OPD of the EFPI sensor is short. In the experiment, a high-finesse fiber optic EFPI sensor with the cavity length of 120 (\\mu ) m is measured, and the second-order frequency component was extracted to recover the cavity length. The standard deviation of the measurement results was 9.132 nm. The measurement range of the Fourier transform method was effectively extended to the short OPD.
  • Keywords
    Fabry-Perot interferometers; Fourier transforms; Optical fiber sensors; Optical interferometry; Fabry-P??rot interferometers; Fourier transforms; optical fiber sensors; white-light interferometry;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2014.2332558
  • Filename
    6844819