• DocumentCode
    707215
  • Title

    Lifetime estimation of power electronics modules considering the target application

  • Author

    Szel, Attila ; Sarkany, Zoltan ; Bein, Marton ; Bornoff, Robin ; Vass-Varnai, Andras ; Rencz, Marta

  • Author_Institution
    Mentor Graphics, Budapest, Hungary
  • fYear
    2015
  • fDate
    15-19 March 2015
  • Firstpage
    332
  • Lastpage
    335
  • Abstract
    The design of power electronics modules and power packages is heavily influenced by thermal concerns. New substrate materials, thinner and thermally more conductive attachment materials are used to decrease the thermal resistance of a given module. When a new material or technology is applied, its reliability has to be tested thoroughly before the module can be considered for production. The reliability or the expected lifetime of the module can be expressed by a number of temperature or power cycles the system can withstand. These numbers however make more sense if they can be linked to the foreseen lifetime of the application where the power module will be applied. In our changing industrial environment the design of power modules is not aimed at maximum lifetime anymore, but it is determined by the application itself. In this article we will summarize the steps which take the designer from the application requirements (mission profile) to the expected lifetime of the application considering the reliability of the power modules used.
  • Keywords
    estimation theory; modules; power electronics; semiconductor device reliability; thermal resistance; conductive attachment material; lifetime estimation; power cycle; power electronics module; power module; power package; reliability testing; substrate material; thermal resistance; Electronic packaging thermal management; Heating; Insulated gate bipolar transistors; Junctions; Multichip modules; Reliability; Temperature; Power electronics; lifetime calculation; mission profile; temperature cycling; thermal simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal Measurement, Modeling & Management Symposium (SEMI-THERM), 2015 31st
  • Conference_Location
    San Jose, CA
  • ISSN
    1065-2221
  • Type

    conf

  • DOI
    10.1109/SEMI-THERM.2015.7100183
  • Filename
    7100183